Prof. Dr. Ulrich Stroth
Courses and Dates
|Title and Module Assignment|
|Plasma Physics 2 Assigned to modules:|
Thu, 10:00–12:00, PH HS2
|Proseminar Plasma Physics Assigned to modules:|
|PS||2||Günter, S. Lauber, P. Manz, P. Stroth, U.|
|Seminar Plasma Physics Assigned to modules:|
|HS||2||Günter, S. Lauber, P. Manz, P. Stroth, U.|
|Exercise to Plasma Physics 2 Assigned to modules:|
Responsible/Coordination: Stroth, U.
|dates in groups|
|FOPRA Experiment 88: Wave Phenomena in a Double Plasma Experiment Assigned to modules:|
Assisstants: Dörsch, G.Dux, R.
|Mentoring in the Bachelor's Program Physics (Professors K–Z) Assigned to modules:|
Märkisch, B. … (insgesamt 25)
Responsible/Coordination: Höffer von Loewenfeld, P.
Offered Bachelor’s or Master’s Theses Topics
- Computer Simulation of Depth-Profiling Methods applying Sputtering on Rough Surfaces
The measurement of concentration profiles of elements as function of depth is important in many fields of materials science and physics. An important and often employed class of depth profiling methods uses sputter depth profiling, i.e. a beam of (typically heavy) energetic ions ejects particles from the sample and proceeds into depth by removal of material. The ejected particles can be detected by various methods, for example by secondary ion mass spectrometry (SIMS) or glow discharge optical emission spectroscopy (GDOES). While these methods are well established for smooth surfaces, their applicability on rough surfaces or multi-phase materials is more questionable and matter of debate since years. The increase of computing power during the last years enables the dynamic simulation of sputter depth profiling methods on three-dimensional surfaces using the existing code SDTrimSP-3D. This code will be used to model depth profiling on rough surfaces. The modeled results will be compared to existing experimental data.
Contact: Dr. Matej Mayer
- suitable as
- Bachelor’s Thesis Physics
- Supervisor: Ulrich Stroth