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Prof. Dr. Ulrich Stroth

Photo von Prof. Ulrich Stroth.
Phone
49 89 3299 2141
Room
PH: 2248
E-Mail
ulrich.stroth@tum.de
Links
Homepage
E2M at IPP
Page in TUMonline
Group
Plasma Surface and Divertor Physics
Job Title
Professorship on Plasma Surface and Divertor Physics
Consultation Hour
on appointment

Courses and Dates

Title and Module Assignment
ArtSWSLecturer(s)Dates
Plasma Physics 2 Assigned to modules:
VO 2 Stroth, U.
Proseminar Plasma Physics Assigned to modules:
PS 2 Günter, S. Lauber, P. Manz, P. Stroth, U.
Seminar Plasma Physics Assigned to modules:
HS 2 Günter, S. Lauber, P. Manz, P. Stroth, U.
Exercise to Plasma Physics 2 Assigned to modules:
UE 2 Cavedon, M.
Responsible/Coordination: Stroth, U.
FOPRA Experiment 12: Introduction to Scanning Electron Microscopy Assigned to modules:
PR 1 Stroth, U.
Assisstants: Balden, M.Curzadd, B.Dörsch, G.
FOPRA Experiment 88: Wave Phenomena in a Double Plasma Experiment Assigned to modules:
PR 1 Stroth, U.
Assisstants: Dörsch, G.Dux, R.
Mentoring in the Bachelor's Program Physics (Professors K–Z) Assigned to modules:
KO 0.2 Kaiser, N. Kienberger, R. Knap, M. Krischer, K. Märkisch, B. … (insgesamt 25)
Responsible/Coordination: Höffer von Loewenfeld, P.

Offered Bachelor’s or Master’s Theses Topics

Computer Simulation of Depth-Profiling Methods applying Sputtering on Rough Surfaces

The measurement of concentration profiles of elements as function of depth is important in many fields of materials science and physics. An important and often employed class of depth profiling methods uses sputter depth profiling, i.e. a beam of (typically heavy) energetic ions ejects particles from the sample and proceeds into depth by removal of material. The ejected particles can be detected by various methods, for example by secondary ion mass spectrometry (SIMS) or glow discharge optical emission spectroscopy (GDOES). While these methods are well established for smooth surfaces, their applicability on rough surfaces or multi-phase materials is more questionable and matter of debate since years. The increase of computing power during the last years enables the dynamic simulation of sputter depth profiling methods on three-dimensional surfaces using the existing code SDTrimSP-3D. This code will be used to model depth profiling on rough surfaces. The modeled results will be compared to existing experimental data.

Contact: Dr. Matej Mayer

suitable as
  • Bachelor’s Thesis Physics
Supervisor: Ulrich Stroth
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